2 search results - page 1 / 1 » Reliability and Yield: A Joint Defect-Oriented Approach |
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
CVPR
2010
IEEE
14 years 1 months ago
2010
IEEE
Hierarchical conditional random fields have been successfully applied to object segmentation. One reason is their ability to incorporate contextual information at different scales....