37 search results - page 2 / 8 » Reliability evaluation of combinational logic circuits by sy... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
GLVLSI
2005
IEEE
13 years 11 months ago
2005
IEEE
Robustness of high fan-in domino circuits is degraded by technology scaling due to exponential increase in leakage. In this paper, we propose a new domino circuit for high fan-in ...