15 search results - page 1 / 3 » Response Surface Modeling of 100nm CMOS Process Technology u... |
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
WSC
2001
13 years 6 months ago
2001
Semiconductor manufacturing is generally considered a cyclic industry. As such, individual producers able to react quickly and appropriately to market conditions will have a compe...