7 search results - page 2 / 2 » Retention-Aware Test Scheduling for BISTed Embedded SRAMs |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
IOLTS
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...