2 search results - page 1 / 1 » Reusing Learned Information in SAT-based ATPG |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
The robustness of engines for ATPG has to be improved to cope with the growing size of circuits. Recently, SAT-based ATPG approaches have been shown to be very robust even on larg...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 2 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...