34 search results - page 7 / 7 » Reusing Scan Chains for Test Pattern Decompression |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
DAC
2003
ACM
14 years 7 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
NOCS
2007
IEEE
14 years 15 days ago
2007
IEEE
Abstract— The behaviour of systems on chip (SOC) is complex because they contain multiple processors that interact through concurrent interconnects, such as networks on chip (NOC...