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VLSID
2007
IEEE
152views VLSI» more  VLSID 2007»
14 years 5 months ago
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip K...
DAC
2004
ACM
14 years 6 months ago
Selective gate-length biasing for cost-effective runtime leakage control
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Denn...
VLSID
2010
IEEE
170views VLSI» more  VLSID 2010»
12 years 11 months ago
Novel Vth Hopping Techniques for Aggressive Runtime Leakage Contro
The continuous increase of leakage power consumption in deep sub-micro technologies necessitates more aggressive leakage control. Runtime leakage control (RTLC) is effective, si...
Hao Xu, Wen-Ben Jone, Ranga Vemuri
DAC
2003
ACM
14 years 6 months ago
Implications of technology scaling on leakage reduction techniques
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
Yuh-Fang Tsai, David Duarte, Narayanan Vijaykrishn...
DAC
2004
ACM
14 years 6 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw