Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
Brian Mullins, Hossein Asadi, Mehdi Baradaran Taho...
This paper discusses a model-based design flow for requirements in distributed embedded software development. Such requirements are specified using a language similar to Linear T...
Luciano Lavagno, Marco Di Natale, Alberto Ferrari,...
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...