35 search results - page 2 / 7 » SOI Transistor Model for Fast Transient Simulation |
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
TSP
2010
12 years 12 months ago
2010
In this paper, we propose an approach to the transient and steady-state analysis of the affine combination of one fast and one slow adaptive filters. The theoretical models are bas...
ISPD
2007
ACM
13 years 6 months ago
2007
ACM
In this paper, we propose fast and efficient techniques to analyze the power grid with accurate modeling of the transistor network. The solution techniques currently available for...