102 search results - page 2 / 21 » Scalable techniques and tools for reliability analysis of la... |
CODES
2010
IEEE
13 years 3 months ago
2010
IEEE
With the continuous scaling of semiconductor technology, the life-time of circuit is decreasing so that processor failure becomes an important issue in MPSoC design. A software so...
SC
2009
ACM
14 years 4 days ago
2009
ACM
We present a scalable temporal order analysis technique that supports debugging of large scale applications by classifying MPI tasks based on their logical program execution order...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...