61 search results - page 4 / 13 » Scan chain clustering for test power reduction |
DAC
2001
ACM
14 years 6 months ago
2001
ACM
VTS
2008
IEEE
14 years 3 days ago
2008
IEEE
DATE
2008
IEEE
14 years 6 days ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
ISQED
2005
IEEE
13 years 11 months ago
2005
IEEE
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...