46 search results - page 2 / 10 » Self Testing SoC with Reduced Memory Requirements and Minimi... |
IEEEPACT
2009
IEEE
13 years 11 months ago
2009
IEEE
—Software testing is hard. The emergence of multicore architectures and the proliferation of bugprone multithreaded software makes testing even harder. To this end, researchers h...
SBACPAD
2007
IEEE
13 years 10 months ago
2007
IEEE
Code Compression has been used to alleviate the memory requirements as well as to improve performance and/or minimize energy consumption. On the other hand, implementing security ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...