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MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
13 years 9 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
DATE
2006
IEEE
110views Hardware» more  DATE 2006»
13 years 11 months ago
An improved RF loopback for test time reduction
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
ISSS
1996
IEEE
134views Hardware» more  ISSS 1996»
13 years 9 months ago
ADOPT: Efficient Hardware Address Generation in Distributed Memory Architectures
An address generation and optimization environment (ADOPT) for distributed memory architectures, is presented. ADOPT is oriented to minimize the area overhead introduced by the us...
Miguel Miranda, Francky Catthoor, Martin Janssen, ...
DATE
2004
IEEE
120views Hardware» more  DATE 2004»
13 years 8 months ago
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...
Paolo Bernardi, Guido Masera, Federico Quaglio, Ma...
NPL
2006
137views more  NPL 2006»
13 years 4 months ago
Minimal Structure of Self-Organizing HCMAC Neural Network Classifier
The authors previously proposed a self-organizing Hierarchical Cerebellar Model Articulation Controller (HCMAC) neural network containing a hierarchical GCMAC neural network and a ...
Chih-Ming Chen, Yung-Feng Lu, Chin-Ming Hong