25 search results - page 1 / 5 » Sequential Circuits Applicable for Detecting Different Types... |
IOLTS
2002
IEEE
13 years 10 months ago
2002
IEEE
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...