9 search results - page 2 / 2 » Simulating and Improving Microelectronic Device Reliability ... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
CASES
2009
ACM
13 years 8 months ago
2009
ACM
Reducing feature sizes and power supply voltage allows integrating more processing units (PUs) on multiprocessor system-on-chip (MPSoC) to satisfy the increasing demands of applic...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...