15 search results - page 2 / 3 » Simulation-Based Diagnosis for Crosstalk Faults in Sequentia... |
DAC
2000
ACM
14 years 5 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
VLSID
1997
IEEE
13 years 9 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...