9 search results - page 2 / 2 » Simultaneous test pattern compaction, ordering and X-filling... |
ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
BMCBI
2010
13 years 2 months ago
2010
Background: The analysis of Inter-Alu PCR patterns obtained from human genomic DNA samples is a promising technique for a simultaneous analysis of many genomic loci flanked by Alu...
FGR
2006
IEEE
13 years 11 months ago
2006
IEEE
Robust gesture recognition in video requires segmentation of the meaningful gestures from a whole body gesture sequence. This is a challenging problem because it is not straightfo...
BMCBI
2010
13 years 5 months ago
2010
Background: Microarray technology allows the simultaneous analysis of thousands of genes within a single experiment. Significance analyses of transcriptomic data ignore the gene d...