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» SoC Design and Test Considerations
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DATE
2003
IEEE
84views Hardware» more  DATE 2003»
13 years 10 months ago
SoC Design and Test Considerations
: Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Designfor-Manufacturability. We present a case study of an SoC test concept, including a...
Martin Schrader, Roderick McConnell
DATE
2007
IEEE
100views Hardware» more  DATE 2007»
13 years 12 months ago
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon W...
ITC
2000
IEEE
53views Hardware» more  ITC 2000»
13 years 10 months ago
Using on-chip test pattern compression for full scan SoC designs
Helmut Lang, Jens Pfeiffer, Jeff Maguire
DAC
2002
ACM
14 years 6 months ago
Embedded software-based self-testing for SoC design
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li...
IPPS
2006
IEEE
13 years 11 months ago
A high level SoC power estimation based on IP modeling
Current electronic system design requires to be concerned with power consumption consideration. However, in a lot of design tools, the application power consumption budget is esti...
David Elléouet, Nathalie Julien, Dominique ...