20 search results - page 2 / 4 » Soft Error Hardening for Asynchronous Circuits |
DATE
2009
IEEE
14 years 10 days ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DDECS
2007
IEEE
13 years 12 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
ICCAD
2004
IEEE
14 years 2 months ago
2004
IEEE
— A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates...
DSD
2009
IEEE
14 years 10 days ago
2009
IEEE