30 search results - page 2 / 6 » Soft Error Modeling and Protection for Sequential Elements |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DSN
2005
IEEE
13 years 7 months ago
2005
IEEE
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture-level studies of soft errors since the architecture can mask many raw errors an...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
MICRO
2006
IEEE
13 years 5 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
IOLTS
2008
IEEE
13 years 11 months ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...