7 search results - page 2 / 2 » Soft error vulnerability aware process variation mitigation |
ISVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...