33 search results - page 5 / 7 » Software-Based Delay Fault Testing of Processor Cores |
MTV
2005
IEEE
13 years 11 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...
ET
2008
13 years 5 months ago
2008
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
ISQED
2002
IEEE
13 years 10 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
ISCA
2005
IEEE
13 years 11 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...