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DATE
2003
IEEE
116views Hardware» more  DATE 2003»
13 years 10 months ago
Statistical Timing Analysis Using Bounds
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
Aseem Agarwal, David Blaauw, Vladimir Zolotov, Sar...
ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
13 years 10 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
DAC
2004
ACM
14 years 5 months ago
Fast statistical timing analysis handling arbitrary delay correlations
CT An efficient statistical timing analysis algorithm that can handle arbitrary (spatial and structural) causes of delay correlation is described. The algorithm derives the entire ...
Michael Orshansky, Arnab Bandyopadhyay
DAC
2005
ACM
13 years 6 months ago
Circuit optimization using statistical static timing analysis
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...
Aseem Agarwal, Kaviraj Chopra, David Blaauw, Vladi...
DAC
2004
ACM
14 years 5 months ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi