In previous work we showed, by Walsh analysis, that summary statistics such as mean, variance, skew, and higher order statistics can be computed in polynomial time for embedded la...
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
We present new results on the well-studied problem of learning DNF expressions. We prove that an algorithm due to Kushilevitz and Mansour [13] can be used to weakly learn DNF form...
Avrim Blum, Merrick L. Furst, Jeffrey C. Jackson, ...
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...