44 search results - page 2 / 9 » Statistical approach in a system level methodology to deal w... |
FTEDA
2006
13 years 4 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
TCAD
2008
13 years 4 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
ISLPED
2006
ACM
13 years 10 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...