32 search results - page 2 / 7 » Statistical identification and analysis of defect developmen... |
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
WIAMIS
2009
IEEE
14 years 7 days ago
2009
IEEE
We propose a novel statistical approach to detect defects in digitized archive film by using temporal information across a number of frames modeled with an HMM. The HMM is traine...
MVA
2007
13 years 7 months ago
2007
In this paper we address automated visual inspection of tablets that may, in contrast to manual tablet sorting, provide objective and reproducible tablet quality assurance. Visual...
DFT
2005
IEEE
13 years 11 months ago
2005
IEEE
Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
ECCV
2004
Springer
13 years 11 months ago
2004
Springer
An automatic tool is developed to identify microbiological data types using computer-vision and statistical modeling techniques. In bacteriophage (phage) typing, representative pro...