3 search results - page 1 / 1 » Statistical noise margin estimation for sub-threshold combin... |
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
ICCAD
1996
IEEE
13 years 8 months ago
1996
IEEE
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...