2286 search results - page 2 / 458 » Statistical timing analysis based on a timing yield model |
TCAD
2010
12 years 11 months ago
2010
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
TCAD
2008
13 years 4 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
DAC
2004
ACM
13 years 8 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
— State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated due to global source of variations and path r...