3 search results - page 1 / 1 » Substrate Bias Effect on Cycling Induced Performance Degrada... |
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
ATS
2009
IEEE
13 years 2 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
MICRO
2010
IEEE
13 years 2 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...