20 search results - page 2 / 4 » Survey of Test Vector Compression Techniques |
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
ICCD
2003
IEEE
14 years 2 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
VTS
2006
IEEE
2006
IEEE
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
13 years 11 months ago
A technique is presented here for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit-wise and pattern-wise corr...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...