151 search results - page 1 / 31 » Systematic test program generation for SoC testing using emb... |
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DAC
2002
ACM
14 years 5 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
DAC
2001
ACM
14 years 5 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...