An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
This paper proposes an efficient automation platform that provides fast and reliable path to analog circuit design for desired specifications. Circuit heuristics and hierarchy a...
The need to reuse the performance macromodels of an analog circuit topology challenges existing regression based modeling techniques. A model of good reusability should have a num...
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...