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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
14 years 2 months ago
Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
DAC
2003
ACM
13 years 11 months ago
Performance trade-off analysis of analog circuits by normal-boundary intersection
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
Guido Stehr, Helmut E. Graeb, Kurt Antreich
ISQED
2005
IEEE
169views Hardware» more  ISQED 2005»
13 years 11 months ago
ASLIC: A Low Power CMOS Analog Circuit Design Automation
This paper proposes an efficient automation platform that provides fast and reliable path to analog circuit design for desired specifications. Circuit heuristics and hierarchy a...
Jihyun Lee, Yong-Bin Kim
DAC
2005
ACM
13 years 7 months ago
A combined feasibility and performance macromodel for analog circuits
The need to reuse the performance macromodels of an analog circuit topology challenges existing regression based modeling techniques. A model of good reusability should have a num...
Mengmeng Ding, Ranga Vemuri
ICCD
2007
IEEE
105views Hardware» more  ICCD 2007»
14 years 3 days ago
Circuit-level mismatch modelling and yield optimization for CMOS analog circuits
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
Mingjing Chen, Alex Orailoglu