9 search results - page 1 / 2 » Test Generation for Acyclic Sequential Circuits with Single ... |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
TCAD
1998
13 years 5 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
MEMOCODE
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...