153 search results - page 1 / 31 » Test Generation for Crosstalk-Induced Faults: Framework and ... |
ET
2002
13 years 9 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
ETS
2009
IEEE
13 years 7 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...