88 search results - page 1 / 18 » Test Selection Based on High Level Fault Simulation for Mixe... |
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to ena...
FDL
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper proposes a methodology for the extension of SystemC to mixed signal systems. An oscillator made up of an inverter chain has been used to test the accuracy and stability...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
IFIP12
2004
13 years 6 months ago
2004
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
ECBS
2011
IEEE
12 years 4 months ago
2011
IEEE
Abstract—Software systems are typically large and exhaustive testing of all possible input parameters is usually not feasible. Testers select tests that they anticipate may catch...