8 search results - page 1 / 2 » Test Set Reordering Using the Gate Exhaustive Test Metric |
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
ECRTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper introduces improvements in partitioning schemes for multiprocessor real-time systems which allow higher processor utilization and enhanced schedulability by using exact...
CHARME
2003
Springer
13 years 8 months ago
2003
Springer
In formal verification, we verify that a system is correct with respect to a specification. Even when the system is proven to be correct, there is still a question of how complete ...
BMCBI
2008
13 years 5 months ago
2008
Background: The analysis of large-scale data sets via clustering techniques is utilized in a number of applications. Biclustering in particular has emerged as an important problem...
ICST
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...