83 search results - page 3 / 17 » Test point insertion based on path tracing |
DATE
1998
IEEE
13 years 10 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
ICCD
1997
IEEE
13 years 10 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
MICRO
2005
IEEE
13 years 11 months ago
2005
IEEE
We introduce techniques to support efficient non-atomic execution of very long traces on a new binary translation based, x86-64 compatible VLIW microprocessor. Incrementally comm...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
Domain testing is a well-known software testing technique. Although research tasks have been initiated in domain testing, automatic test data generation based on character string ...
ITC
1997
IEEE
13 years 10 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...