3 search results - page 1 / 1 » Test vector chains for increased targeted and untargeted fau... |
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...