22 search results - page 1 / 5 » Test-Sequence Generation with Hol-TestGen with an Applicatio... |
TAP
2007
Springer
13 years 11 months ago
2007
Springer
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
SAC
2006
ACM
13 years 5 months ago
2006
ACM
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
HASE
2008
IEEE
13 years 11 months ago
2008
IEEE
Web applications often use dynamic pages that interact with each other by accessing shared objects, e.g., session objects. Interactions between dynamic pages need to be carefully ...
EVOW
1999
Springer
13 years 9 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...