15 search results - page 3 / 3 » Test-access mechanism optimization for core-based three-dime... |
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
DSD
2005
IEEE
13 years 11 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...