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    » Testing Flash Memories for Tunnel Oxide Defects
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    VLSID
    2008
    IEEE
    122views VLSI» more  VLSID 2008»
    Testing Flash Memories for Tunnel Oxide Defects
    13 years 11 months ago
    Testing Flash Memories for Tunnel Oxide Defects
    Download  www.ece.wisc.edu
    — Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
    Mohammad Gh. Mohammad, Kewal K. Saluja
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    DAC
    2009
    ACM
    125views Computer Architecture» more  DAC 2009»
    Improving STT MRAM storage density through smaller-than-worst-case transistor sizing
    14 years 5 months ago
    Improving STT MRAM storage density through smaller-than-worst-case transistor sizing
    Download  cobweb.ecn.purdue.edu
    This paper presents a technique to improve the storage density of spin-torque transfer (STT) magnetoresistive random access memory (MRAM) in the presence of significant magnetic t...
    Wei Xu, Yiran Chen, Xiaobin Wang, Tong Zhang
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