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VTS
2003
IEEE
95views Hardware» more  VTS 2003»
13 years 10 months ago
Testing SoC Interconnects for Signal Integrity Using Boundary Scan
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
ICCD
2003
IEEE
113views Hardware» more  ICCD 2003»
13 years 10 months ago
Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
DATE
2003
IEEE
90views Hardware» more  DATE 2003»
13 years 10 months ago
Extending JTAG for Testing Signal Integrity in SoCs
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
Nisar Ahmed, Mohammad H. Tehranipour, Mehrdad Nour...
DAC
2001
ACM
14 years 6 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
ET
2002
85views more  ET 2002»
13 years 5 months ago
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
Mehrdad Nourani, Amir Attarha