47 search results - page 1 / 10 » Testing and built-in self-test - A survey |
CORR
2011
Springer
12 years 11 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
DFT
2009
IEEE
13 years 11 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
CSREAESA
2009
13 years 5 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The proposed microcode-based memory BIST unit is more e ci...
ETS
2006
IEEE
13 years 10 months ago
2006
IEEE
