11 search results - page 2 / 3 » Testing for Missing-Gate Faults in Reversible Circuits |
ET
2010
13 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
IEICET
2008
13 years 5 months ago
2008
ATS
2005
IEEE
13 years 7 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
EURODAC
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...