13 search results - page 3 / 3 » The Complexity of Adding Failsafe Fault-Tolerance |
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
COMPSAC
2007
IEEE
13 years 8 months ago
2007
IEEE
The world is increasingly dependent on critical infrastructures such as the electric power grid, water, gas, and oil transport systems, which are susceptible to cascading failures...