359 search results - page 72 / 72 » The Parameterized Complexity of Counting Problems |
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
Abstract— Thermal issues are a primary concern in the threedimensional (3D) integrated circuit (IC) design. Temperature, area, and wire length must be simultaneously optimized du...
QEST
2007
IEEE
13 years 11 months ago
2007
IEEE
We give an overview of GRIP, a symmetry reduction tool for the probabilistic model checker PRISM, together with experimental results for a selection of example specifications. 1 ...
CORR
2008
Springer
13 years 5 months ago
2008
Springer
Classic algorithms for sequential pattern discovery, return all frequent sequences present in a database. Since, in general, only a few ones are interesting from a user's poin...
DSD
2002
IEEE
13 years 10 months ago
2002
IEEE
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...