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DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
DAGSTUHL
2006
13 years 6 months ago
2006
We show that Kolmogorov complexity and such its estimators as universal codes (or data compression methods) can be applied for hypothesis testing in a framework of classical mathe...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
IS
2007
13 years 5 months ago
2007
For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...