1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...