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DATE
2006
IEEE

Power constrained and defect-probability driven SoC test scheduling with test set partitioning

10 years 3 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is terminated as soon as the first fault is detected. Defect probabilities of individual cores are used to guide the test scheduling and the peak-power constraint is considered in order to limit the test concurrency. Test set partitioning is used to divide a test set into several test sequences so that they can be tightly packed into the two-dimensional space of power and time. The partitioning of test sets is integrated into the test scheduling process. A heuristic has been developed to find an efficient test schedule which leads to reduced expected test time. Experimental results have shown the efficiency of the proposed test scheduling approach.
Zhiyuan He, Zebo Peng, Petru Eles
Added 10 Jun 2010
Updated 10 Jun 2010
Type Conference
Year 2006
Where DATE
Authors Zhiyuan He, Zebo Peng, Petru Eles
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