28 search results - page 6 / 6 » Three-Dimensional Simulation of Semiconductor Devices |
ISLPED
2009
ACM
14 years 12 hour ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
MICRO
2008
IEEE
13 years 12 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ICC
2007
IEEE
13 years 9 months ago
2007
IEEE
With the advance of semiconductor manufacturing, There are many approaches to deal with these problems. EDA, and VLSI design technologies, circuits with even higher Adding discrete...